Seeking Alpha

PyroGenesis Confirms Third-Party SEM Analysis Supports Pilot-Scale Fumed Silica Morphology Consistent with Commercial-Grade Fumed Silica

MONTREAL, July 28, 2025 (GLOBE NEWSWIRE) -- PyroGenesis Inc. (PYR:CA) (“PyroGenesis”) (http://pyrogenesis.com) (TSX: PYR) (OTCQX: PYRGF) (FRA: 8PY1), a high-tech ...
AZOM

Forensic Insights: Analyzing Glass Particles from Smartphone Damage using SEM, EDS, and Micro-CT

Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...
Semiconductor Engineering

Overview Of 103 Research Papers On Automatic SEM Image Analysis Algorithms For Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
AZoNano

Using SEM for Structural Analysis in Nanomaterials

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
AZOM

Using Tabletop SEM for Surface Analysis of Cemented Carbide

While the First Industrial Revolution focused on the production of textiles and the invention of the steam engine, the Second Industrial Revolution was typified by the invention of machinery for mass ...